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Conferences > CLEO_Europe > 1998 > CThH > CThH54

Photorefractivity of CdTe:Ge at 1.06 and 1.32 μm

K. Shcherbin, S. Oaouiov, and P. Poplavko

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Abstract

CdTe is studied intensively as promising material for the real time holographic recording in the near infrared because it ensures the largest gain factor as compared to the other photorefractive semiconductors. In this report we present the results of characterisation of photorefractive germanium doped CdTe crystals grown in different Ukrainian laboratories and compere the results with that known for vanadium doped CdTe [1].

© 1998 IEEE

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