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Characterization of Defects in Bi12GeO20 by Specific Thermal and Optical Spectroscopic Methods

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Abstract

The photorefractive materials Bi12SiO20 (BSO) and Bi12GeO20 (BGO) are among the most sensitive for reversible volume holographic recording [1]. The band transport model in conjunction with a simple two energy level diagram is commonly used to describe grating formation [2]. The recording light excites electrons from an energy level A located at 2.6 eV below the conduction band to this latter [3]. The free photoelectrons drift under the action of an applied electric field from illuminated to unilluminated zones where they remain trapped at a level B 1.3 eV below the conduction band.

© 1987 Optical Society of America

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