Growth and characterization of photorefractive Bi12TiO2Ø (BTO)

D. Rytz; M.B. Klein; B.A. Wechsler; R.N. Schwartz; K.W. Kirby

doi:10.1364/PRM.1987.WB4

Topical Meeting on Photorefractive Materials, Effects, and Devices
Technical Digest Series (Optica Publishing Group, 1987),
paper WB4
•https://doi.org/10.1364/PRM.1987.WB4

Growth and characterization of photorefractive Bi₁₂TiO_2Ø (BTO)

D. Rytz, M.B. Klein, B.A. Wechsler, R.N. Schwartz, and K.W. Kirby

Photorefractive Materials 1987

Los Angeles, California United States
12–14 August 1987
ISBN:

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Materials 2: BSO/BGO/BTO (WB)

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D. Rytz, M. B. Klein, B. A. Wechsler, R. N. Schwartz, and K. W. Kirby, "Growth and characterization of photorefractive Bi12TiO2Ø (BTO)," in Topical Meeting on Photorefractive Materials, Effects, and Devices, Technical Digest Series (Optica Publishing Group, 1987), paper WB4.

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Abstract

Bi₁₂TiO_2Ø (BTO) is an isomorph of Bi₁₂SiO_2Ø (BSO) and Bi₁₂GeO_2Ø (BGO). Each material is cubic (point group 23) and exhibits interesting photorefractive properties. BTO, although much less extensively investigated, has several specific advantages, namely its lower optical activity by a factor of 3.5 compared to BSO and BGO [1], its larger electro-optic coefficient [2,3], and its higher sensitivity at 633 nm [4]. In recent years, Petrov and coworkers [4] have demonstrated very high values of beam coupling gain and diffraction efficiency at 633 nm in BTO using anisotropic scattering and the ac-field effect.

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