Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Determination of X-ray indices of refraction by interferometry

Not Accessible

Your library or personal account may give you access

Abstract

As well known, the propagation of an electromagnetic field inside matter is described by the complex index of refraction n = 1-δ+iβ, where δ and β account respectively for phase retardation and absorption. δ and β are related by the Kramers-Kronig relationships, which theoretically, permits calculating δ(λ) from experimental determination of β(λ) [1]. Practically, however, the method gives questionable results near absorption edges, mainly because only discrete absorption data can be obtained in a finite wavelength range and some assumptions on the material structure must be introduced. More direct methods exist, based on reflectivity measurements [2-5]. Again, assumptions on the material structure must be introduced, which makes the results questionable near absorption edges. In all cases, the influence of β significantly limits the accuracy of the determination of δ. In addition, it is often found that the index values depends strongly on the conditions of deposition of materials. Such methods, which often make use of composite stacks, are therefore not well adapted.

© 1994 Optical Society of America

PDF Article
More Like This
Determination of surface roughness of silicon wafers using soft-x-ray scattering*

J. F. MacKay, C. Teichert, D. E. Savage, M. G. Lagally, and P. Wagner
TuB.3 Physics of X-Ray Multilayer Structures (PXRAYMS) 1994

Determination of refractive indices of optical wafers by interferometric method

Hee Joo Choi, Hwan Hong Lim, In-Ho Bae, Han Seb Moon, Myoungsik Cha, Tae Bong Eom, and Jung Jin Ju
TUP6_16 Conference on Lasers and Electro-Optics/Pacific Rim (CLEO/PR) 2009

Determination of Principal Refractive Indices of Birefringent Thin Films

F. Horowitz and H. A. Macleod
WC11 Optical Interference Coatings (OIC) 1988

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.