Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

X-ray Supermirrors: Novel multilayer structures for broad band hard X-ray applications

Not Accessible

Your library or personal account may give you access

Abstract

With the increased availability of hard X-ray (≥ 20 keV) synchrotron sources and a concurrent wish for hard X-ray telescopes. the need for hard X-ray optics has become considerable. For some applications crystals and periodic multilayers are desirable; for others the bandwidth of these may be too narrow. A wider bandwidth can be obtained by using total reflection from heavy elements. This approach. however, is impractical for harder X-rays since it is limited by the inverse proportionality between the critical angle of total reflection and the energy. One solution to this broad-band reflection problem may be the supermirror: a multilayer structure where the bi-layer thickness is gradually changed from top to bottom. In such a structure radiation with different wavelengths will have the criteria for constructive interference fulfilled at different depths in the multilayer. If the bi-layer thicknesses are changed sufficiently slowly. simultaneous diffraction of a continuum of X-ray energies can be obtained. The multilayered supermirror was originally designed for neutron applications1 such as increasing the throughput of guide-tubes. For neutrons, where absorption is extremely low for most materials. reflectivities up to95 can be obtained in a continuous band up to 3 times the critical angle or energy2. For X-rays. the absorption is considerably larger and this strongly influences the performance of the X-ray supermirror.

© 1994 Optical Society of America

PDF Article
More Like This
Broad-band focusing of hard x-rays using a supermirror

Peter Høghøj, Eric Ziegler, Jean Susini, Andreas K. Freund, Karsten Dan Joensen, and Paul Gorenstein
WC.9 Physics of X-Ray Multilayer Structures (PXRAYMS) 1994

Glancing-Incidence X-ray Analysis of multilayer structures

D. K. G. de Boer, A. J. G. Leenaers, and W.W. van den Hoogenhof
TuA.2 Physics of X-Ray Multilayer Structures (PXRAYMS) 1994

Characterization of interface structure in multilayers using specular x-ray reflectance

Eric E. Fullerton
TuA.1 Physics of X-Ray Multilayer Structures (PXRAYMS) 1994

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.