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On-Chip Carrier-Envelope Phase Scanner of Few-Cycle Oscillator Beams

Václav Hanus, Beatrix Fehér, Zsuzsanna Pápa, Judit Budai, Zilong Wang, Pallabi Paul, Adriana Szeghalmi, and Péter Dombi

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Abstract

We performed an on-air measurement of CEP spatial distribution of focused few-cycle laser oscillator beam. The on-chip probe exploits the CEP sensitivity of electric currents in dielectrics exposed to the strong field.

© 2022 The Author(s)

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