Abstract
A Rugate notch filter is fabricated by atomic layer deposition. By regulating the thickness ratio of and in a nanoscale layer, the refractive index is tailored between the refractive indices of the two materials. With the method of equivalent refractive index, the continuously variable refractive index of the designed Rugate filter is dispersed into several discrete ones, so that it can be realized by the refractive index tailoring. To coincide with the thickness, the nanoscale layer is iteratively deposited in the equivalent layer. The experimental reflectance matches the designed one well, and the average reflectance is 86.7% (510–590 nm).
© 2014 Optical Society of America
Full Article | PDF ArticleMore Like This
Adriana Szeghalmi, Michael Helgert, Robert Brunner, Frank Heyroth, Ulrich Gösele, and Mato Knez
Appl. Opt. 48(9) 1727-1732 (2009)
Edward P. Donovan, D. Van Vechten, Alan D. F. Kahn, Carmine A. Carosella, and Graham K. Hubler
Appl. Opt. 28(14) 2940-2944 (1989)
Daniel Poitras, Stéphane Larouche, and Ludvik Martinu
Appl. Opt. 41(25) 5249-5255 (2002)