Abstract
This paper introduces an integrated fiber physical unclonable function (PUF) verification system based on a semiconductor laser source at substantially lower complexity and cost than existing alternatives. A source sub-section consisting of a linear frequency-swept semiconductor laser is used in combination with an optical frequency domain reflectometry (OFDR)/LiDAR-based measurement sub-section in order to conduct fiber identification via measurement of the unique Rayleigh reflection pattern of a section of optical fiber. When using these Rayleigh reflection patterns as PUFs, this technique results in a maximum equal error rate (EER) of 0.15% for a 5-cm section of optical fiber and an EER of less than 1% for a 4-cm section. These results demonstrate that the system can serve as a robust method fiber identification for device and communication verification applications.
© 2019 Optical Society of America
Full Article | PDF ArticleMore Like This
Pantea Nadimi Goki, Stella Civelli, Emanuele Parente, Roberto Caldelli, Thomas Teferi Mulugeta, Nicola Sambo, Marco Secondini, and Luca Potì
J. Opt. Commun. Netw. 15(10) E63-E73 (2023)
Benjamin R. Anderson, Ray Gunawidjaja, and Hergen Eilers
Appl. Opt. 56(10) 2863-2872 (2017)
Brian C. Grubel, Bryan T. Bosworth, Michael R. Kossey, Hongcheng Sun, A. Brinton Cooper, Mark A. Foster, and Amy C. Foster
Opt. Express 25(11) 12710-12721 (2017)