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Spatial variant gloss measurement of dielectric materials based on a polarized camera

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Abstract

This study proposes an imaging method for gloss measurement solely by a single shot from a polarized camera. The system, comprising a polarized camera and well-diffused LED plate light, is inspired by the framework of ASTM D523, and it acquires images at 60° incident direction. The polarization characteristics of dielectric material samples were analyzed. A regression model was developed by using natural color system gloss scale and a commercial gloss meter. Subsequently, the gloss and spatial resolutions of this method were verified using various types of measurement samples. From experiments regarding different benchmarks, we concluded that the proposed method performs sufficiently for spatial variant gloss measurement.

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Data availability

Data underlying the results presented in this paper are not publicly available at this time but may be obtained from the authors upon reasonable request.

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