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Abstract
The figure of merit (FoM) of Ti:sapphire (Ti:Sa) crystals is a generally used means to evaluate the quality of the crystals. Despite the importance of Ti:Sa, the question of FoM measurement precision stayed out of focus, while the commercially available spectrometers provide unsatisfactory ${{3}}\sigma$ precision reaching $\pm60\%$. In this paper, we present a setup for a single-pass high-precision transmission measurement for three different wavelengths (532, 780, and 1560 nm) based on Nd:YAG and Er:YAG lasers. A synchronous detection via a double integrated sphere enabled us to achieve the transmission uncertainty of 0,01–0,03%. With the presented setup, we show that it is possible to determine the FoM values with $3\sigma$ precision of ${\rm{\pm 7}},{{5}}\;\%$. Owing to the high FoM precision, we were able to trace spatial inhomogeneities of an unannealed Ti:Sa crystal produced by a commercial manufacturer Crytur. Our measurements demonstrate that the FoM values can be significantly affected by the crystal inhomogeneities and angular mismatch between the $c$ axis of the Ti:Sa and polarization orientation.
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