High-finesse measurements at low temperatures

Jean-Paul Richard and Jeffrey J. Hamilton

Appl. Opt. 30(25), 3560-3561 (1991)  View: HTML | PDF

Arm-length measurement of an interferometer using the optical-frequency-scanning technique

Yucong Zhu, Hirokazu Matsumoto, and Tadanao O'ishi

Appl. Opt. 30(25), 3561-3562 (1991)  View: HTML | PDF

Aberration compensation in confocal microscopy

C. J. R. Sheppard and Min Gu

Appl. Opt. 30(25), 3563-3568 (1991)  View: HTML | PDF

Ensquared power for obscured circular pupils with off-center imaging

Louis M. Beyer, Stephen H. Cobb, and Lavern C. Clune

Appl. Opt. 30(25), 3569-3574 (1991)  View: HTML | PDF

Position offsets in curved-channel microchannel plate detectors

D. M. Hassler, G. J. Rottman, and G. M. Lawrence

Appl. Opt. 30(25), 3575-3581 (1991)  View: HTML | PDF

Absolute standardless calibration of photodetectors based on quantum two-photon fields

A. N. Penin and A. V. Sergienko

Appl. Opt. 30(25), 3582-3588 (1991)  View: HTML | PDF

Aberration properties of a Czerny–Turner spectrograph using plane-holographic diffraction grating

N. C. Das

Appl. Opt. 30(25), 3589-3597 (1991)  View: HTML | PDF

Holographic diffraction gratings generated by aberrated wave fronts: application to a high-resolution far-ultraviolet spectrograph

Robert Grange and Michel Laget

Appl. Opt. 30(25), 3598-3603 (1991)  View: HTML | PDF

Nd:YAG laser machining with multilevel resist kinoforms

Mats Ekberg, Michael Larsson, Aldo Bolle, and Sverker Hård

Appl. Opt. 30(25), 3604-3606 (1991)  View: HTML | PDF

Use of holographic optical elements in speckle metrology. Part 3: application to fracture mechanics

Chandra Shakher and Hira Lal Yadav

Appl. Opt. 30(25), 3607-3611 (1991)  View: HTML | PDF

Three-color laser-diode interferometer

Peter de Groot

Appl. Opt. 30(25), 3612-3616 (1991)  View: HTML | PDF

Double sinusoidal phase-modulating laser diode interferometer for distance measurement

Osami Sasaki, Tadahiko Yoshida, and Takamasa Suzuki

Appl. Opt. 30(25), 3617-3621 (1991)  View: HTML | PDF

Phase-locked laser diode interferometer: high-speed feedback control system

Takamasa Suzuki, Osmai Sasaki, Katsuhiro Higuchi, and Takeo Maruyama

Appl. Opt. 30(25), 3622-3626 (1991)  View: HTML | PDF

Fourier fringe analysis: the two-dimensional phase unwrapping problem

Donald J. Bone

Appl. Opt. 30(25), 3627-3632 (1991)  View: HTML | PDF

Imaging and radiometric properties of microlens arrays

N. F. Borrelli, R. H. Bellman, J. A. Durbin, and W. Lama

Appl. Opt. 30(25), 3633-3642 (1991)  View: HTML | PDF

Diffraction-limited blazed reflection diffractive microlenses for oblique incidence fabricated by electron-beam lithography

Teruhiro Shiono and Hisahito Ogawa

Appl. Opt. 30(25), 3643-3649 (1991)  View: HTML | PDF

Analysis of miniature FLIR test targets

I-Fu Shih and David B. Chang

Appl. Opt. 30(25), 3650-3655 (1991)  View: HTML | PDF

Interferometric method for concurrent measurement of thermo-optic and thermal expansion coefficients

John M. Jewell, Charles Askins, and Ishwar D. Aggarwal

Appl. Opt. 30(25), 3656-3660 (1991)  View: HTML | PDF

Optical properties of sol-gel spin-coated TiO₂ films and comparison of the properties with ion-beam-sputtered films

N. Ozer, H. Demiryont, and J. H. Simmons

Appl. Opt. 30(25), 3661-3666 (1991)  View: HTML | PDF

Electron micrography and x-ray study of dip-lacquered LiF (220)

J. Palmari, M. Rasigni, G. Rasigni, F. E. Christensen, A. Hornstrup, and H. W. Schnopper

Appl. Opt. 30(25), 3667-3672 (1991)  View: HTML | PDF

Ophthalmic lenses: accurately characterizing transmittance of photochromic and other common lens materials

Denwood F. Ross

Appl. Opt. 30(25), 3673-3677 (1991)  View: HTML | PDF