Abstract

A rotating sample holder is invaluable in x-ray emission analysis of nonhomogeneous samples because when such samples are rotated, different sample areas are observed continuously, thus permitting an averaging of irregularities. This feature of the sample holder is of significance in the nondestructive testing of materials in that it provides more reliable analytical data. The rotating sample holder described in this paper is designed and constructed for use on a General Electric XRD6 x-ray emission spectrometer. The reduced x-ray intensity variation obtained by continuous sample rotation results in significant improvement in over-all precision compared with intensity variation obtained by rotation only between readings.

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