Applied Industrial Optics: Spectroscopy, Imaging and Metrology
in Proceedings Imaging and Applied Optics 2014
Part of Imaging and Applied Optics
13–17 July 2014, Seattle, Washington, United States
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At AIO, researchers from public and private entities with experience in overcoming the challenges of deploying and commercializing new technology meet research groups striving to get their technology out of the lab. Topics include instrumentation, metrology, imaging systems, applied spectroscopy, clinical diagnostics, harsh environment systems and emerging laser, fiber and photonic technologies.
Also known as: Applied Industrial Optics: Spectroscopy, Imaging and Metrology