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Generating a True Color Image with Data from Scanning White-Light Interferometry by Using a Fourier Transform

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Abstract

In this paper we propose a method to generate a true color image in scanning white-light interferometry (SWLI). Previously, a true color image was obtained by using a color camera, or an RGB multichannel light source. Here we focused on acquiring a true color image without any hardware changes in basic SWLI, in which a monochrome camera is utilized. A Fourier transform method was used to obtain the spectral intensity distributions of the light reflected from the sample. RGB filtering was applied to the intensity distributions, to determine RGB values from the spectral intensity. Through color corrections, a true color image was generated from the RGB values. The image generated by the proposed method was verified on the basis of the RGB distance and peak signal-to-noise ratio analysis for its effectiveness.

© 2019 Optical Society of Korea

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References

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2018 (1)

2017 (1)

2015 (1)

P. de Groot, "Principles of interference microscopy for the measurement of surface topography," Adv. Opt. Photonics 7, 1‒65 (2015)
[Crossref]

2014 (1)

J. L. Beverage, X. C. de Lega, M. F. Fay, "Interferometric microscope with true color imaging," Proc. SPIE 9203, 92030S (2014)

2013 (1)

S. Bianco, A. Bruna, F. Naccari, R. Schettinid, "Color correction pipeline optimization for digital cameras," J. Electron. Imaging 22, 023014 (2013)
[Crossref]

2012 (1)

2004 (1)

1999 (1)

1994 (1)

Barni, M.

M. Barni, Document and Image compression .

Beverage, J. L.

J. L. Beverage, X. C. de Lega, M. F. Fay, "Interferometric microscope with true color imaging," Proc. SPIE 9203, 92030S (2014)

Bianco, S.

S. Bianco, A. Bruna, F. Naccari, R. Schettinid, "Color correction pipeline optimization for digital cameras," J. Electron. Imaging 22, 023014 (2013)
[Crossref]

Bruna, A.

S. Bianco, A. Bruna, F. Naccari, R. Schettinid, "Color correction pipeline optimization for digital cameras," J. Electron. Imaging 22, 023014 (2013)
[Crossref]

Bui, S. H.

J. Schmit, S. H. Bui, D. Chen, M. J. Novak, Side illumination in interferometry U.S. Patent .

Chen, D.

J. Schmit, S. H. Bui, D. Chen, M. J. Novak, Side illumination in interferometry U.S. Patent .

Cho, Y.

Choi, G.

de Groot, P.

de Lega, X. C.

J. L. Beverage, X. C. de Lega, M. F. Fay, "Interferometric microscope with true color imaging," Proc. SPIE 9203, 92030S (2014)

P. de Groot, X. C. de Lega, "Signal modeling for lowcoherence height-scanning interference microscopy," Appl. Opt. 43, 4821‒4830 (2004)
[Crossref]

Deck, L.

Dong, J.-T.

Fay, M. F.

J. L. Beverage, X. C. de Lega, M. F. Fay, "Interferometric microscope with true color imaging," Proc. SPIE 9203, 92030S (2014)

Hearn, D. R.

D. R. Hearn, Fourier transform interferometry .

Kim, G. H.

Kim, N.

Kim, S. W.

Lee, S. W.

Lee, Y.

Lu, R.-S.

Malacara, Z.

Z. Malacara, M. Servín, Interferogram Analysis For Optical Testing .

Munteanu, F.

J. Schmit, F. Munteanu, Full-color images produced by white-light interferometry U.S. Patent .

Naccari, F.

S. Bianco, A. Bruna, F. Naccari, R. Schettinid, "Color correction pipeline optimization for digital cameras," J. Electron. Imaging 22, 023014 (2013)
[Crossref]

Novak, M. J.

J. Schmit, S. H. Bui, D. Chen, M. J. Novak, Side illumination in interferometry U.S. Patent .

Pahk, H. J.

Schettinid, R.

S. Bianco, A. Bruna, F. Naccari, R. Schettinid, "Color correction pipeline optimization for digital cameras," J. Electron. Imaging 22, 023014 (2013)
[Crossref]

Schmit, J.

J. Schmit, F. Munteanu, Full-color images produced by white-light interferometry U.S. Patent .

J. Schmit, S. H. Bui, D. Chen, M. J. Novak, Side illumination in interferometry U.S. Patent .

Servín, M.

Z. Malacara, M. Servín, Interferogram Analysis For Optical Testing .

Welstead, S. T.

S. T. Welstead, Fractal and wavelet image compression techniques .

Adv. Opt. Photonics (1)

P. de Groot, "Principles of interference microscopy for the measurement of surface topography," Adv. Opt. Photonics 7, 1‒65 (2015)
[Crossref]

Appl. Opt. (5)

Curr. Opt. Photon. (1)

J. Electron. Imaging (1)

S. Bianco, A. Bruna, F. Naccari, R. Schettinid, "Color correction pipeline optimization for digital cameras," J. Electron. Imaging 22, 023014 (2013)
[Crossref]

Proc. SPIE (1)

J. L. Beverage, X. C. de Lega, M. F. Fay, "Interferometric microscope with true color imaging," Proc. SPIE 9203, 92030S (2014)

Other (7)

J. Schmit, S. H. Bui, D. Chen, M. J. Novak, Side illumination in interferometry U.S. Patent .

J. Schmit, F. Munteanu, Full-color images produced by white-light interferometry U.S. Patent .

Z. Malacara, M. Servín, Interferogram Analysis For Optical Testing .

P. de Groot, Optical Measurement of Surface Topography .

S. T. Welstead, Fractal and wavelet image compression techniques .

M. Barni, Document and Image compression .

D. R. Hearn, Fourier transform interferometry .

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