Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Journal Home About Current Issue All Issues

Generating a True Color Image with Data from Scanning White-Light Interferometry by Using a Fourier Transform

Jin-Yong Kim, Seungjae Kim, Min-Gyu Kim, and Heui Jae Pahk

Open Access Open Access

Abstract

In this paper we propose a method to generate a true color image in scanning white-light interferometry (SWLI). Previously, a true color image was obtained by using a color camera, or an RGB multichannel light source. Here we focused on acquiring a true color image without any hardware changes in basic SWLI, in which a monochrome camera is utilized. A Fourier transform method was used to obtain the spectral intensity distributions of the light reflected from the sample. RGB filtering was applied to the intensity distributions, to determine RGB values from the spectral intensity. Through color corrections, a true color image was generated from the RGB values. The image generated by the proposed method was verified on the basis of the RGB distance and peak signal-to-noise ratio analysis for its effectiveness.

© 2019 Optical Society of Korea

PDF Article

References

  • View by:
  • Article Order
  • Year
  • Author
  • Publication
  1. Z. Malacara, M. Servín, Interferogram Analysis For Optical Testing .
  2. L. Deck, P. de Groot, "High-speed noncontact profiler based on scanning white-light interferometry," Appl. Opt. 33, 7334‒7338 (1994)
    [Crossref]
  3. P. de Groot, "Principles of interference microscopy for the measurement of surface topography," Adv. Opt. Photonics 7, 1‒65 (2015)
    [Crossref]
  4. P. de Groot, Optical Measurement of Surface Topography .
  5. S. W. Kim, G. H. Kim, "Thickness-profile measurement of transparent thin-film layers by white-light scanning interferometry," Appl. Opt. 38, 5968‒5973 (1999)
    [Crossref]
  6. N. Kim, S. W. Lee, Y. I , H. J. Pahk, "Accurate roughness measurement using a method for evaluation and interpolation of the validity of height data from a scanning white-light interferometer," Curr. Opt. Photon. 1, 604‒612 (2017)
  7. J. Schmit, F. Munteanu, Full-color images produced by white-light interferometry U.S. Patent .
  8. J. L. Beverage, X. C. de Lega, M. F. Fay, "Interferometric microscope with true color imaging," Proc. SPIE 9203, 92030S (2014)
  9. J. Schmit, S. H. Bui, D. Chen, M. J. Novak, Side illumination in interferometry U.S. Patent .
  10. P. de Groot, X. C. de Lega, "Signal modeling for lowcoherence height-scanning interference microscopy," Appl. Opt. 43, 4821‒4830 (2004)
    [Crossref]
  11. J.-T. Dong, R.-S. Lu, "Sensitivity analysis of thin-film thickness measurement by vertical scanning white-light interferometry," Appl. Opt. 51, 5668‒5675 (2012)
    [Crossref]
  12. G. Choi, Y. Lee, S. W. Lee, Y. Cho, H. J. Pahk, "Simple method for volumetric thickness measurement using a color camera," Appl. Opt. 57, 7550‒7558 (2018)
    [Crossref]
  13. D. R. Hearn, Fourier transform interferometry .
  14. S. Bianco, A. Bruna, F. Naccari, R. Schettinid, "Color correction pipeline optimization for digital cameras," J. Electron. Imaging 22, 023014 (2013)
    [Crossref]
  15. S. T. Welstead, Fractal and wavelet image compression techniques .
  16. M. Barni, Document and Image compression .

2018 (1)

2017 (1)

2015 (1)

P. de Groot, "Principles of interference microscopy for the measurement of surface topography," Adv. Opt. Photonics 7, 1‒65 (2015)
[Crossref]

2014 (1)

J. L. Beverage, X. C. de Lega, M. F. Fay, "Interferometric microscope with true color imaging," Proc. SPIE 9203, 92030S (2014)

2013 (1)

S. Bianco, A. Bruna, F. Naccari, R. Schettinid, "Color correction pipeline optimization for digital cameras," J. Electron. Imaging 22, 023014 (2013)
[Crossref]

2012 (1)

2004 (1)

1999 (1)

1994 (1)

Barni, M.

M. Barni, Document and Image compression .

Beverage, J. L.

J. L. Beverage, X. C. de Lega, M. F. Fay, "Interferometric microscope with true color imaging," Proc. SPIE 9203, 92030S (2014)

Bianco, S.

S. Bianco, A. Bruna, F. Naccari, R. Schettinid, "Color correction pipeline optimization for digital cameras," J. Electron. Imaging 22, 023014 (2013)
[Crossref]

Bruna, A.

S. Bianco, A. Bruna, F. Naccari, R. Schettinid, "Color correction pipeline optimization for digital cameras," J. Electron. Imaging 22, 023014 (2013)
[Crossref]

Bui, S. H.

J. Schmit, S. H. Bui, D. Chen, M. J. Novak, Side illumination in interferometry U.S. Patent .

Chen, D.

J. Schmit, S. H. Bui, D. Chen, M. J. Novak, Side illumination in interferometry U.S. Patent .

Cho, Y.

Choi, G.

de Groot, P.

de Lega, X. C.

J. L. Beverage, X. C. de Lega, M. F. Fay, "Interferometric microscope with true color imaging," Proc. SPIE 9203, 92030S (2014)

P. de Groot, X. C. de Lega, "Signal modeling for lowcoherence height-scanning interference microscopy," Appl. Opt. 43, 4821‒4830 (2004)
[Crossref]

Deck, L.

Dong, J.-T.

Fay, M. F.

J. L. Beverage, X. C. de Lega, M. F. Fay, "Interferometric microscope with true color imaging," Proc. SPIE 9203, 92030S (2014)

Hearn, D. R.

D. R. Hearn, Fourier transform interferometry .

Kim, G. H.

Kim, N.

Kim, S. W.

Lee, S. W.

Lee, Y.

Lu, R.-S.

Malacara, Z.

Z. Malacara, M. Servín, Interferogram Analysis For Optical Testing .

Munteanu, F.

J. Schmit, F. Munteanu, Full-color images produced by white-light interferometry U.S. Patent .

Naccari, F.

S. Bianco, A. Bruna, F. Naccari, R. Schettinid, "Color correction pipeline optimization for digital cameras," J. Electron. Imaging 22, 023014 (2013)
[Crossref]

Novak, M. J.

J. Schmit, S. H. Bui, D. Chen, M. J. Novak, Side illumination in interferometry U.S. Patent .

Pahk, H. J.

Schettinid, R.

S. Bianco, A. Bruna, F. Naccari, R. Schettinid, "Color correction pipeline optimization for digital cameras," J. Electron. Imaging 22, 023014 (2013)
[Crossref]

Schmit, J.

J. Schmit, F. Munteanu, Full-color images produced by white-light interferometry U.S. Patent .

J. Schmit, S. H. Bui, D. Chen, M. J. Novak, Side illumination in interferometry U.S. Patent .

Servín, M.

Z. Malacara, M. Servín, Interferogram Analysis For Optical Testing .

Welstead, S. T.

S. T. Welstead, Fractal and wavelet image compression techniques .

Adv. Opt. Photonics (1)

P. de Groot, "Principles of interference microscopy for the measurement of surface topography," Adv. Opt. Photonics 7, 1‒65 (2015)
[Crossref]

Appl. Opt. (5)

Curr. Opt. Photon. (1)

J. Electron. Imaging (1)

S. Bianco, A. Bruna, F. Naccari, R. Schettinid, "Color correction pipeline optimization for digital cameras," J. Electron. Imaging 22, 023014 (2013)
[Crossref]

Proc. SPIE (1)

J. L. Beverage, X. C. de Lega, M. F. Fay, "Interferometric microscope with true color imaging," Proc. SPIE 9203, 92030S (2014)

Other (7)

J. Schmit, S. H. Bui, D. Chen, M. J. Novak, Side illumination in interferometry U.S. Patent .

J. Schmit, F. Munteanu, Full-color images produced by white-light interferometry U.S. Patent .

Z. Malacara, M. Servín, Interferogram Analysis For Optical Testing .

P. de Groot, Optical Measurement of Surface Topography .

S. T. Welstead, Fractal and wavelet image compression techniques .

M. Barni, Document and Image compression .

D. R. Hearn, Fourier transform interferometry .

Cited By

Optica participates in Crossref's Cited-By Linking service. Citing articles from Optica Publishing Group journals and other participating publishers are listed here.

Alert me when this article is cited.


Select as filters
Select Topics Cancel
Top
       
© Copyright 2022 | Optica Publishing Group. All Rights Reserved
Privacy | Terms of Use