Abstract

By effectively suppressing the nonlinear sweep noise and random range of wavelength sweep in the optical frequency domain reflectometer, the theoretical spatial resolution and uniform sweep distribution are delivered for high sensing accuracy. A strain accuracy of ±0.51 με is realised with a 5 mm sensing resolution, while the accuracy is ±5.89 με with a 1 mm sensing resolution. Theoretical limitation between the strain accuracy and sensing resolution is further studied for the sub-millimetre resolution sensing. It is found that signal to noise ratio and frequency bandwidth of the calculated cross-correlation are critical factors in measuring accuracy. Increasing the sweep range can provide a better spatial frequency step for a high signal to noise ratio in the cross-correlation. With a 130 nm sweep range, the measurement accuracy is limited to ±19.31 με with a 0.5 mm sensing resolution. Besides, for the long-distance sensing of 104 m, the measurement accuracy is ±8.72 με with a 1 mm sensing resolution.

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