Abstract
A new software-based method for eliminating voltage spikes in near infrared (NIR) spectra measured with germanium (Ge) detectors is described. The digitised signal from the detector is analysed statistically in order to reject spikes before the average signal at a given wavelength is calculated and stored. This analysis is an integral part of the data acquisition process and its properties and implementation are described in detail. The protocol is used to measure NIR luminescence spectra of inorganic materials and we show that acquisition times for spectra with equivalent signal-to-noise ratios are shorter by an order of magnitude than for conventional experiments. This low-cost methodology is easily adapted to other spectroscopic techniques involving Ge detectors.
© 1995 NIR Publications
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