Abstract

The complex optical and dielectric functions of the energy of an electromagnetic wave are calculated for a film of tantalum (V) oxide in the short-wavelength region, including the fundamental-absorption region. An additive combination of the Forouhi–Bloomer and Lorentz models is constructed to compute these functions. Versions of the Forouhi–Bloomer model with a dipole-transition matrix element that is independent of the wave energy are considered, along with a modified model. It is established that the modified model has an advantage when describing broad-band dielectric amorphous media. The optical band gap computed from the Forouhi–Bloomer and Lorentz models is compared with the value determined from the Tautz extrapolation.

© 2012 OSA

Optical Propagation in Sheet and Pattern Generated Films of Ta₂O₅

D. H. Hensler, J. D. Cuthbert, R. J. Martin, and P. K. Tien
Appl. Opt. 10(5) 1037-1042 (1971)

Extended x-ray absorption fine structure measurements on asymmetric bipolar pulse direct current magnetron sputtered Ta₂O₅ thin films

S. Maidul Haque, Pankaj R. Sagdeo, D. D. Shinde, J. S. Misal, S. N. Jha, D. Bhattacharyya, and N. K. Sahoo
Appl. Opt. 54(22) 6744-6751 (2015)

Optical properties and microstructure of Ta₂O₅ biaxial film

Hongji Qi, Xiudi Xiao, Hongbo He, Kui Yi, and Zhengxiu Fan
Appl. Opt. 48(1) 127-133 (2009)

Self-consistent optical constants of SiO₂ and Ta₂O₅ films

Luis V. Rodríguez-de Marcos, Juan I. Larruquert, José A. Méndez, and José A. Aznárez
Opt. Mater. Express 6(11) 3622-3637 (2016)

Laser plasma-induced damage characteristics of Ta₂O₅ films

Hongyuan Chen, Guoying Feng, Weixing Fan, Jinghua Han, Yaguo Li, and Qiuyu Lai
Opt. Mater. Express 9(7) 3132-3145 (2019)