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Quality control of the diffraction structure of display reflection holograms

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Abstract

Subject of study. The archival storage of information in the diffraction structure (fringe pattern) of display reflection holograms is studied. Aim of study. The aim is to develop methodologies for assessing the quality of the diffraction structure of display holograms recorded according to Denisyuk’s scheme for the quality control of display holograms and their diffraction structures during operation and long-term storage. Method. The methods for estimating the quality of an optical image that can be used in estimating the parameters of a holographic image characterizing the diffraction structure properties are discussed. Main results. The differences in the formation of the diffraction structure of monochrome and color display holograms are considered. When a 30×40cm hologram recorded on a high-resolution Ultimate 04C halide-silver full-color-sensitive photomaterial is exposed to actinic radiation in a wide range of visible spectrum at an illumination level of not less than 1300 lux for more than 25,000 h, the diffraction structure of the hologram degrades, and the contrast of the reconstructed holographic image is reduced by 20%. Photographs of holographic images were quantitatively compared based on the calculation for the average contrast value. The importance of developing methods for quantifying the wave field of an arbitrary-shaped object reconstructed from display holograms is emphasized. The proposed photogrammetry method is recommended for use when characterizing holographic images in the absence of a real object. An algorithm for the analog-to-digital conversion of information contained in display holograms is presented to control changes in the parameters of holographic images both under external influence and during storage. Practical significance. The outlined technique for controlling the parameters of holographic images is an essential tool for addressing challenges related to the archival storage of information within the diffraction structure of display reflection holograms. The described algorithm and its optical implementation scheme offer practical utility for assessing the quality of display holograms and monitoring their diffraction structure throughout storage and operational stages.

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