Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Journal Home About Current Issue All Issues

A device for measuring the taper of plates by an interference method

B. E. Moshkin and S. V. Maksimenko

Not Accessible

Your library or personal account may give you access

Abstract

This paper describes a device for determining the taper of transparent plates with high accuracy from the displacement of interference fringes.

© 2011 OSA

PDF Article
More Like This
Method for a deflection-type refractometer measuring the fringe shift by using linear Fresnel zone plates

Alireza Amani and YiDong Tan
Appl. Opt. 62(33) 8823-8831 (2023)

Wavelength measurement by Fourier analysis of interference fringes through a plane parallel plate

Choonghwan Lee, Heejoo Choi, Jiung Kim, Myoungsik Cha, and Jonghan Jin
Appl. Opt. 56(35) 9638-9643 (2017)

Measurement device for noise factor of microchannel plate

Liu Lei, Huang Zhijian, Pan Tao, and Qian Yunsheng
Appl. Opt. 51(7) 883-887 (2012)

View More...

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use