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Forced scanning—a method for improving linearity of static performance in optoelectronic position sensors

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We discuss a method for achieving linearity of static performance in an optoelectronic system for determining the position of a source via relative movement of the image of a small emission source relative to the sight line to the source; this approach increases the accuracy with which the coordinates of such sighting targets can be determined.

© 2016 Optical Society of America

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