Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Study of optical and piezoelectric properties of thin-film Si-SiO2-ZnO structure via pulsed-laser optoacoustic spectroscopy

Not Accessible

Your library or personal account may give you access

Abstract

The results of an investigation of the optical and piezoelectric properties of a Si-SiO2-ZnO microstructure via pulsed-laser optoacoustic spectroscopy are presented. Using optoacoustic probing, the speed of an acoustic wave propagating in the zinc oxide layer was calculated to be 3.01×103  m/s, and the acoustic wave absorption coefficient was determined to be 3.45  dB/cm. The acousto-optic constant M2 for the ZnO film was determined to be 8.78×10−18  s3/g using the modified Dixon method.

© 2017 Optical Society of America

PDF Article
More Like This
Response of piezoelectric transducers used in pulsed optoacoustic spectroscopy

E. T. Nelson and C. K. N. Patel
Opt. Lett. 6(7) 354-356 (1981)

Amorphous In2Ga2ZnO7 films with adjustable structural, electrical and optical properties deposited by magnetron sputtering

Xianjie Zhou, Jiwen Xu, Ling Yang, Xiaosheng Tang, Qiuping Wei, and Zhiming Yu
Opt. Mater. Express 5(7) 1628-1634 (2015)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.