Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Low-temperature test objects for alignment of thermal imaging systems

Not Accessible

Your library or personal account may give you access

Abstract

Structurally simple low-temperature dashed test objects (miras) with elements at temperatures lower than ambient are presented. These devices are based on thermoelectric elements (Peltier modules) with interchangeable thermal-insulating substrates mounted on them. The substrates have rectangular openings and heat-emitting conducting layers applied to the surface. Experimental thermograms of the models of test-objects are presented. The proposed devices are designed to align thermal imaging systems. They enhance the possibilities of investigating such systems and can be applied either separately or within infrared collimators.

© 2021 Optical Society of America

PDF Article
More Like This
Use of thermal sieve to allow optical testing of cryogenic optical systems

Dae Wook Kim, Wenrui Cai, and James H. Burge
Opt. Express 20(11) 12378-12392 (2012)

Simple, low-contrast thermal-resolution test target

Jon Geist, James E. Luther, Donald B. Novotny, and Jouko Vahakangas
Appl. Opt. 31(16) 2978-2980 (1992)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.