Abstract

Subject of the study. The Fresnel zone plate with circular zones made of pinholes, also known as a photon sieve, and the measurement setup for its quality characteristics testing are studied. The aim of the study is to explore the potential of using photon sieves in optoelectronic devices, develop a quality control scheme and measurement setup layout, evaluate the selected manufacturing method, and assess the practical applicability of photon sieve samples. Method. The development level of Fresnel zone plates in relation to optoelectronic devices is analyzed. The quality characteristics of manufactured Fresnel zone plates are tested using a measurement setup prototype. The measurement results are compared with calculated values. Main results. The study considers the potential of Fresnel zone plates with pinholes for use in optoelectronic devices. Developed samples are used to verify available methods for manufacturing Fresnel zone plates and their practical applicability. A measurement setup scheme for assessing the quality characteristics of Fresnel zone plates is proposed, taking into account their low energy efficiency, and it implements standardized test methods for the point spread function, line spread function, and modulation transfer function. A measurement setup prototype, based on an interferometer (as a source of monochromatic radiation) and an analyzing unit using a digital camera, was manufactured. The measurement setup prototype for testing the quality of Fresnel zone plate samples (point spread function, line spread function, modulation transfer function) was tested. The results were compared, and it was found that the subsidiary maxima of the line spread function are significantly higher than the calculated values, but the primary maximum width of the line spread function coincides with the calculated value within the range of 0.1 to 1 relative units, with an error no greater than the pixel size of the digital camera’s analyzing unit. Practical significance. While the manufactured Fresnel zone plate samples do not meet the quality characteristics of modern imaging optical systems, the concept of using the photon sieve to create ultra-light space-based optoelectronic systems holds promise. It is worth considering alternative manufacturing options to create Fresnel zone plate samples with greater accuracy in pinhole placement. Recent developments have improved energy efficiency, making the photon sieve a practical option for space instrumentation in the future. The measurement setup prototype for current low energy efficiency Fresnel zone plate samples is efficient and was validated during testing at a wavelength of 0.6328 µm. As manufacturing technology improves and higher-aperture Fresnel zone plates are created, both methods and quality control measurement schemes can be enhanced to ensure reliable results in testing the quality characteristics of Fresnel zone plates.

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