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Near-infrared optics of nanoparticles embedded silica thin films

Yanpei Tian, Alok Ghanekar, Lijuan Qian, Matthew Ricci, Xiaojie Liu, Gang Xiao, Otto Gregory, and Yi Zheng

Open Access Open Access

Abstract

This work investigates experimentally the near-infrared optical properties of SiO2 thin film embedded with tungsten (W) nanoparticles at varying volume fractions. The samples are prepared by using the technique of magnetron sputtering. The formation and distribution of W nanoparticles are characterized using transmission electron microscopy, and the volume fraction of W nanoparticles is validated by Auger electron spectroscopy. Near- and mid-infrared diffuse reflectance measurements are conducted using Fourier transform infrared spectroscopy. The samples exhibit wavelength selective optical response in the near-infrared region and are suitable for applications involving selective thermal emitters/absorbers. Measured reflectance data is utilized to estimate the effective dielectric function of the nano-composites. Calculated reflectance spectra in different samples are compared to the measured spectra using the experimentally measured dielectric function of these samples in the near-infrared region. Reflectance spectra after thermal annealing at different temperature are compared to show how the thermal treatment affects the optical properties of samples. Optimized structures are proposed for thermal emitters and absorbers with different volume fractions of W nanoparticles.

© 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

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Figures (7)
Fig. 1
Fig. 1 (a) Schematic of samples consisting of 400 nm-thick SiO2 film on top of 9 μm W foil as a substrate. SiO2 thin film is doped with W nanoparticles of 5 nm radius with volume fraction of 10%, 20%, and 30%. (b) Schematic of magnetron sputtering system employed to fabricate samples of W nanoparticles embedded in SiO2 thin films.

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Fig. 2
Fig. 2 (a) and (b) TEM images of the fabricated samples with volume fractions 10% and 30%, respectively. (c) Measured atomic concentrations of W, Si, and O at different depth for samples of different volume fractions 10%, 20%, and 30%, using Auger electron spectroscopy.

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Fig. 3
Fig. 3 Comparison of reflectance spectra of samples with different volume fractions 10% and 20%, before and after thermal annealing

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Fig. 4
Fig. 4 Comparison of measured and calculated reflectance spectra of samples with different volume fractions 10%, 20%, and 30%, respectively.

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Fig. 5
Fig. 5 Estimated refractive indices of fabricated samples with various volume fractions of 10%, 20%, and 30%, respectively.

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Fig. 6
Fig. 6 Reflectance spectra of samples before thermal treatment with different volume fractions 10%, 20%, and 30%, respectively.

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Fig. 7
Fig. 7 (a) Incident solar spectrum (AM 1.5, 50 kW−2) and emission spectra of an ideal selective thermal absorber and emitter. (b) and (c) Hemispherical emissivity of the proposed thermal emitter and absorber with different volume fractions 10% and 20%, respectively.

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Tables (2)

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Table 1 Lorentz-Drude oscillator parameters of fabricated samples

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Table 2 Structure of proposed selective thermal emitter and absorber

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Equations (1)

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ε ( ω ) = ε ∞ + ∑ k = 1 N s k 1 − ( ω ω k ) 2 − j Γ k ( ω ω k ) .
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