Abstract
We present an optical model to describe the luminescence from oriented emitting dipoles in a birefringent medium and validate the theoretical model through its applications to a dye doped organic thin film and organic light emitting diodes (OLEDs). We demonstrate that the optical birefringence affects not only far-field radiation characteristics such as the angle-dependent emission spectrum and intensity from the thin film and OLEDs, but also the outcoupling efficiency of OLEDs. The orientation of emitting dipoles in a birefringent medium is successfully analyzed from the far-field radiation pattern of a thin film using the model. In addition, the birefringent model presented here provides a precise analysis of the angle-dependent EL spectra and efficiencies of OLEDs with the determined emitting dipole orientation.
© 2015 Optical Society of America
1. Introduction
Light emission from organic materials has been an important research topic during the last few decades because of its scientific and technological importance, particularly due to the success of organic light emitting diodes (OLEDs). The classical dipole model has been used to understand emission characteristics from thin films and devices [1–7], such as emission patterns [4,7–11], power dissipation modes including the outcoupling efficiency from thin films and devices [7,9,10,12–22], position of recombination zones in electroluminescent (EL) devices [12], and the orientation of emitting dipoles in thin films [18,23–28]. Until recently, the emitting dipoles were commonly assumed to be randomly oriented in an isotropic medium for small molecule based organic EL devices because there are no apparent driving forces that would yield a preferred dipole orientation for the emitters. Recently, however, a large number of organic thin films have been reported to possess a preferred orientation, leading to optical birefringence [29–32]. Furthermore, some emitters doped in organic semiconducting layers showed preferentially oriented transition dipole moment along the horizontal direction (parallel to the substrate) [18,23–28]. For these systems, the assumption of a random orientation of the dipoles in an isotropic medium no longer applies and thus leads to inaccurate predictions for the emission patterns (intensity and spectrum) and power dissipation modes in thin films and related devices. Wasey et al. [5] attempted to analyze emission in a polymer layer while accounting for birefringence. They proved that emitting dipoles are aligned horizontally in a spin coated thin polymer film by the analysis of far-field radiation from the film. Further research analyzed dipole radiation in the anisotropic medium with an arbitrary optical axis [33]. However, unfortunately, they did not perform the quantitative analysis of the dipole orientation in a birefringent medium and did not correlate the dipole orientation and the optical birefringence with the outcoupling efficiency of OLEDs.
In this paper, we present an optical model originally developed by Chance el al [1]. to describe the luminescence from emitting dipoles in a birefringent medium and validate the theoretical model through its applications to a dye doped organic thin film and OLEDs to describe the far-field radiation, outcoupling efficiency, and orientation of emitting dipoles.
2. Theoretical background
2.1. Luminescence from an oriented emitting dipole embedded in a birefringent medium
Consider a dipole embedded in an infinite anisotropic medium whose optical axis is parallel to the z-axis with the refractive index tensor represented by
When the dipole is embedded in this anisotropic medium, the radiated power from the dipole in the absence of an interface is given by [1] where is the dipole moment, ω is the oscillation frequency, c is the speed of light, and ⊥ and ∥ represent a vertical and horizontal orientation of the dipole, respectively. If the ordinary refractive index is larger than the extraordinary refractive index (negative birefringence), the radiated power from the horizontal dipole is larger than that of the vertical dipole in the birefringent emitting layer, and vice versa. The net radiated power from the dipole in the absence of an interface is described by taking the dipole distribution aswhere α is the ratio of the horizontal dipole (2/3 for an isotropic orientation).If the emitting layer is sandwiched by two layers, as shown in Fig. 1, the spontaneous decay rate of the dipole and the radiation power are modified according to the Purcell effect [34] as follows,
In the above expression, F is the Purcell factor, while () and P () are the radiative decay rate and the radiated power from the dipole in the structure (in free space), respectively. In the same manner, the Purcell factor for the outcoupled power, can be defined as the ratio of the outcoupled power, to the radiated power in free space, asModification of the radiated power from the dipole in the structure can be described by the integration of the power dissipation function p(u) [1]:where k is the wavenumber, u is the normalized in-plane wave vector, and denotes the reflected electric field at the position of the dipole. The net radiated power emitted by the dipole in the structure is described by the power dissipation function for each dipole orientation and electric field polarization asIf the dipole is located at distances d and s from the interfaces between layer 1 and 2, and layer 2 and 3, respectively, the power dissipation functions for the dipole in the anisotropic medium are obtained by calculating the radiated electric field from the dipole using the appropriate boundary conditions as where are the Fresnel’s reflection coefficients of the TM and TE waves at the interfaces as described in Appendix, and R denotes a reflection coefficient that includes a phase shift in the anisotropic medium containing the dipole described by Wave propagation in the anisotropic medium is affected by the refractive index of the medium parallel to the direction of electric field polarization. The relation between the wave vector components and the propagation angle is illustrated in Fig. 1. If the out-of-plane wave vector is real, the wave vector components of a TE wave obey the relations while the relations for a TM wave are Here, is the effective refractive index of layer 1 calculated using the refractive index ellipsoid when the power propagation angle measured from the substrate isTo calculate the outcoupled power, we decompose the power dissipation function into contributions from the positive and negative z-directions for a real out-of-plane wave vector as follows [3]:
The first and the second terms on the right-hand side of the above expression represent the power propagating in the positive and negative z-directions, respectively. Using the relation between reflectance, transmittance, and absorption, we divide the outcoupled power of the dipole to layer 3 using Eq. (8)-(10) as where the transmittance of the TM and TE waves () in this case are described in Appendix. The outcoupled power is calculated by integrating Eq. (16)-(18) up to the critical angles. Since the critical angles for an external medium consisting of air are and for the birefringent medium, is described by2.2. Efficiency of an organic EL device with a birefringent emitting layer
The external quantum efficiency (EQE) of an organic EL device is defined as the quantum ratio of the number of the photons emitted from the structure to air to the number of injected charge carriers. The emission process in the device can be divided into 4 steps and the EQE can be described as an integration of those elements [7]:
Here γ is the electrical balance factor (# of generated excitons / # of injected charge carriers), χ is the ratio of radiative excitons with spin statics (# of radiative excitons / # of generated excitons), s(λ) is the normalized photon spectrum of the emitter (# of radiative excitons with λ / # of radiative excitons) satisfying is the effective radiative quantum efficiency (# of emitted photons with λ / # of radiative excitons with ), and is the outcoupling efficiency (# of emitted photons to air / # of emitted photons with wavelength λ).Because of the modification of the radiative decay rate in the structure, the effective radiative quantum efficiency and the outcoupling efficiency of an organic EL device are described in terms of the Purcell factors as:
The EQE is then obtained usingThe Purcell factors can be obtained by calculating the radiated power emitted by the dipole in the absence of an interface , in the structure P, and the outcoupled power as given by Eq. (3), (7), and (19), respectively.2.3. Far-field radiation
In the expression for the outcoupled power, the in-plane wave vector u can be converted to a solid angle. Then, Eq. (19) becomes a function of the solid angle in layer 3 () as
and the outcoupled powers as a function of are given by where and . The far-field radiation power spectrum per unit area from the dipole with respect to viewing angle is described according to the photon spectrum as3. Experimental
A mixed layer of 4,4’,4”-tris(carbazol-9-yl)-triphenylamine [TCTA] and bis-4,6-(3,5-di-3-pyridylphenyl)-2-methylpyrimidine [B3PYMPM] was used as a dielectric birefringent medium and a phosphorescent dye of bis(2-phenylpyridine)iridium(III)(2,2,6,6-tetramethylheptane-3,5-diketonate) [Ir(ppy)2tmd] [20,35] doped in the mixed layer was used as an emitter. The mixed layer of TCTA and B3PYMPM was reported as an exciplex-forming host in OLEDs [11,18,20,36–38] that enables effective energy transfer to the Ir(ppy)2tmd. Figure 2 shows the structure of the OLEDs with thick TCTA:B3PYMPM layers. The structure of the OLEDs consists of glass substrate / ITO (70 nm) / MoO3 (1 nm) / TCTA (10 nm) / TCTA:B3PYMPM:Ir(ppy)2tmd (45.8:45.8:8.4 mole %, 125 nm) / B3PMYPM (10 nm) / LiF (1 nm) / Al (100 nm). The doping region of Ir(ppy)2tmd was varied for different emission zones in the same device structure. Four kinds of OLEDs were fabricated, having 20-nm-thick EMLs located 40 nm, 55 nm, 70 nm, and 110 nm from the Al cathode and are referred to device 1, 2, 3, and 4, respectively. Thin MoO3 and LiF layers were used for efficient hole and electron injection, respectively. The films and OLEDs were fabricated using thermal evaporation in vacuum.
Variable angle spectroscopic ellipsometry (VASE, J. A. Woolam M-2000 spectroscopic ellipsometer) was used to analyze the molecular orientation and optical constants (refractive index n and extinction coefficient k) of the TCTA:B3PYMPM film deposited on the pre-cleaned silicon substrate. Optical constants were analyzed using J. A. Woolam Complete EASE software. Analysis of the optical constants was initiated using the Cauchy model at the transparent region, expanded to the whole region by the B-spline model satisfying the Kramers-Krönig consistency, and completed by inserting Gaussian oscillators into the result of the B-spline model. The uniaxial model was applied using separate analyses for the ordinary and the extraordinary axes. An angle-dependent photoluminescence (PL) analysis [23] was applied to determine the orientation of the transition dipole moment of Ir(ppy)2tmd in the TCTA:B3PYMPM host. We analyzed the dipole orientation with a 30 nm thick film of the Ir(ppy)2tmd-doped TCTA:B3PYMPM layer deposited onto a fused silica substrate. The substrate was attached to a half-cylinder lens made of fused silica and fixed on a programmedrotation stage. The molecules in the film were excited by a He-Cd laser (325 nm, CW) and angle-dependent intensity profiles of the PL escaping through the lens were measured using a fiber spectrometer (Maya2000, OceanOptics Inc.). For the analysis, TM-polarized light was selected using a linear polarizer. The experimental set-up and details are described in [18] and [23].
The current-voltage-luminescence characteristics of the OLEDs were analyzed using the Keithley 2400 and the SpectraScan PR 650 (Photo Research). The angle-dependent emission spectra of the devices were measured using an Ocean Optics S2000 fiber optic spectrometer with constant current for angles ranging from 0° to 85°. Measurements were performed automatically using the programmed rotation stage. The EQEs of the OLEDs were obtained by calculating the ratio between the numbers of emitted photons and injected electrons and calibrated by considering the angle-dependent emission distribution of the OLEDs.
4. Results and discussion
4.1. Optical birefringence and the dipole orientation
The optical constants of the TCTA:B3PYMPM layer displayed negative birefringence (no > ne) as shown by Fig. 3(a), indicating the horizontal orientation of the molecules in the mixedlayer. The difference between the ordinary and extraordinary refractive index n is ~0.2 in the visible region. Planar-shaped B3PYMPM molecules with hydrogen bonds result in a horizontal molecular orientation even in the vacuum-deposited organic film [31,39]. Although they were mixed with the TCTA molecules, the horizontally preferred molecular orientation was observed in the mixed film.
Figure 3(b) shows the angular emission intensity profile of the TM wave from the film at the wavelength λ = 520 nm corresponding to the PL maximum. Optical simulations for the far-field emission of the TM wave from the film to the semi-infinite fused silica substrate was performed using Eq. (27) to determine the dipole orientation of the emitter, under an assumption that the molecules in the thin layer are excited uniformly throughout the layer. The horizontal dipole ratio (α) was taken as a fitting parameter for the experimental data. The experimental data are in good agreement with the theoretical prediction using α = 0.74 across the entire emission angle when the birefringence of the emitting layer was considered. In contrast, the theoretical fittings under the assumption of an isotropic medium with an ordinary refractive index fit only part of the experimental data, i.e., over 40°. In other words, the accuracy of the predicted emission dipole orientation is significantly improved by accounting for the birefringence of the emission layer. The unexpected peak at around 40° in the measurement comes from reflection of the encapsulation glass at the opposite side of the substrate.
4.2. Emission spectra of OLEDs
The emission spectra of the four different OLEDs along the normal direction with respect to the substrate are shown in Fig. 4. The emission spectra exhibit more pronounced longer-wavelength vibronic peaks as the distance between the doping region and the cathode increases. Emission spectra of the OLEDs were used to predict the location of the emission zone in the devices by fitting the far field radiation with the location of the emission zone as a parameter, where the emission zone geometry is assumed to be that of a sheet. The mean emission zones of the four devices were determined to be located at 50 nm (device 1), 60 nm (device 2), 75 nm (device 3), and 120 nm (device 4) from the cathode, all of which are located in the doped regions of the devices. Note that the optical birefringence is not effective in this calculation because only the ordinary refractive index of the medium affects light propagating in the direction normal to the substrate. However, consideration of the birefringence is important in determining the far-field radiation at other angles.
The measured angle-dependent EL spectra of devices 1, 2, 3, and 4 between 0° and 80° are depicted in Fig. 5. As the emission zone was far apart from the cathode, the angular emission spectra were broadened and the intensities at high angles were increased. The calculated far-field radiant spectra with the consideration of the effects of birefringence (solid lines) agreed with the experimental results in intensity, resonance wavelength, spectral width, and angular dependency of the radiation. Calculated angular radiant spectra using the ordinary index without the consideration of the birefringence (isotropic model) are shown in Fig. 5 as the broken lines. The differences between the calculated and the experimental results are not significant in the case of device 1, 2, and 3, but are significant in the device 4, which has a significant difference between the resonance wavelength of the micro cavity and the PL maximum of the Ir(ppy)2tmd. The birefringent model yielded larger radiant intensities than the isotropic model and better explains the far-field emission characteristics of the device.
4.3. Efficiency of OLEDs
Current density-voltage-luminance (J-V-L) characteristics of the four different OLEDs are depicted in Fig. 6(a). They show general diode characteristics with the same turn-on voltage of 2.7 V and low leakage current. EQEs of the OLEDs versus current density are shown in Fig. 6(b). The maximum EQEs were 28.0%, 28.8%, 27.9%, and 11.6% for device 1, 2, 3, and 4, respectively. Their maximum EQEs were obtained at the low current density, indicating that there are electrical losses at high current densities in the devices. Calculated maximum EQEs of OLEDs using Eq. (23) as a function of the distance from the cathode to the emission zone are displayed in Fig. 6(c). We chose the electrical balance factor γ = 1 (no electrical loss), the spin statistics factor χ = 1 due to the phosphorescent emitter, the radiative quantum efficiency q = 0.96 [20], and the ratio of the horizontal dipole α = 0.74 in the calculation. The lines in Fig. 6(c) show the theoretically predicted maximum EQEs using the birefringent model (solid line), the isotropic model using the ordinary refractive index (dashed line), and the isotropic model using the effective refractive index of (dotted line). The experimentally obtained EQEs from the OLEDs matched very well with the theoreticalprediction when the birefringence in the emitting layer was considered. However, isotropic model using the effective refractive index or the ordinary refractive index resulted in significant deviation from the experimentally obtained EQEs. Use of the ordinary index in the isotropic model predicted lower EQEs than the experimental ones because the low extraordinary refractive index of the medium reduces the losses from waveguided light and surface plasmon polaritons. In addition, the radiation from the horizontal dipole is enhanced in the negative birefringent medium because the intrinsic radiation power of the horizontal dipole in Eq. (2) is larger than that of the vertical dipole in Eq. (1).
5. Conclusion
We have presented an optical model for emission in a birefringent medium and have validated the theoretical model by applying it to a thin film and OLEDs. We have demonstrated that optical birefringence affects not only far-field radiation characteristics such as emission spectra from thin films and OLEDs, but also the efficiency of OLEDs. The emitting dipole orientation in a birefringent medium has been successfully analyzed from the far-field radiation pattern of a thin film. In addition, the birefringent model has provided a precise analysis of angle-dependent EL spectra and EQEs of OLEDs with the determined emitting dipole orientation.
Appendix
The Fresnel’s reflection and transmission coefficients for TM and TE polarized light traveling from layer a to b are expressed in terms of the wave vector components and the refractive index of layers a and b. If the layer a has an anisotropic refractive index tensor
the Fresnel’s reflection and transmission coefficients for TM and TE polarized light are given by where and The reflectance and transmittance of the light traveling from layer a to b are given byAcknowledgments
This work was supported by the Mid-career Researcher Program through an NRF (National Research Foundation) grant funded by the MSIP (Ministry of Science, ICT and Future Planning) (2014R1A2A1A01002030).
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