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Abstract
The authors report an error in the phrasing and citation of the reference to simulation model input data in [Opt. Express 31(14), 232602023 [CrossRef] ]. The original phrasing misplaced “heat capacity” after the in-text citation, where the intended phrase was “electrical conductivity,” and heat capacity was intended to be cited with thermal conductivity as external measured data. In the reference itself, the source cited for thermal conductivity and heat capacity was errantly cited as H. Kizuka, et al., Jpn. J. Appl. Phys. 54, 053201 (2015) [CrossRef] . The JJAP paper shows data for both thermal properties of VO2; however, the data utilized for our model input parameters are found in [J. Miranda, et al., Phys. Rev. B 98, 075144 (2018)], including heat capacity data reproduced therein from [T. Kawakubo and T. Nakagawa, J. Phys. Soc. Jap. 19, 4 (1964)]. There are no effects on the simulated data nor conclusions of this article due to the error.
© 2023 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement
Original text:
In [1]: Thermal conductivity values are based on external measured data [2], and heat capacity is derived from measured electrical resistivity, published in previous work by our group [5].
Corrected text:
Thermal conductivity and heat capacity values are based on external measured data References [3] and [4], and electrical conductivity is derived from measured electrical resistivity, published in previous work by our group [5] and [6].
References
1. M. Lust, I. Vitebskiy, I. Anisimov, et al., “Thermo-optic VO2-based silicon waveguide mid-infrared router with asymmetric activation thresholds and large bi-stability,” Opt. Express 31(14), 23260 (2023). [CrossRef]
2. H. Kizuka, T. Yagi, J. Jia, et al., “Temperature dependence of thermal conductivity of VO2 thin films across metal–insulator transition,” Jpn. J. Appl. Phys. 54, 053201 (2015). [CrossRef]
3. J. Miranda, Y. Ezzahri, K. Joulain, et al., “Modeling of the electrical conductivity, thermal conductivity, and specific heat capacity of VO2,” Phys. Rev. B 98, 075144 (2018). [CrossRef]
4. T. Kawakubo and Nakagawa, “Phase transition in VO2,” J. Phys. Soc. Jap. 19(4), 517 (1964). [CrossRef]
5. M. Lust, S. Chen, C.E. Wilson, et al., “High-contrast, highly textured VO2 thin films integrated on silicon substrates using annealed Al2O3 buffer layers,” J. Appl. Phys 127, 1 (2020). [CrossRef]
6. S. Chen, M. Lust, and N. Ghalichechian, “Multiphysics simulation of hypersensitive microbolometer sensor using vanadium dioxide and air suspension for millimeter wave imaging,” Microsys Tech. , 27, 2815 (2021). [CrossRef]