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Extended-range fiber polarimetric strain sensor

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Abstract

We describe a frequency-modulation technique that is applicable to two-beam interferometric systems illuminated by semiconductor diode lasers. The technique permits a determination of the optical path difference between the two arms of the interferometer and is used here to extend the range of a fiber polarimetric strain sensor by determining the order of the particular polarimetric fringe under consideration.

© 1987 Optical Society of America

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