Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > CLEO_SI > 2019 > SF2G > SF2G.6

Atom Probe Tomography with Extreme-Ultraviolet Light

Luis Miaja-Avila, Ann N. Chiaramonti, Paul T. Blanchard, Norman A. Sanford, David R. Diercks, and Brian P. Gorman

Not Accessible

Your library or personal account may give you access

Abstract

We have adapted an atom probe tomograph (APT) with an extreme ultraviolet (EUV) source. The EUV photon energies open a direct photoionization pathway unavailable in conventional near-UV APT.

© 2019 The Author(s)

PDF Article
More Like This
Coherent Extreme-Ultraviolet Source Applied to Atom Probe Tomography

Luis Miaja-Avila, Ann N. Chiaramonti, Paul T. Blanchard, Norman A. Sanford, Henry C. Kapteyn, Margaret M. Murnane, David R. Diercks, and Brian P. Gorman
FTu5C.3 Frontiers in Optics (FiO) 2018

Atom probe tomography using an extreme ultraviolet pulsed light source

Luis Miaja-Avila, Benjamin W. Caplins, Ann N. Chiaramonti, Jake M. Garcia, and Norman A. Sanford
ETh4A.1 Compact EUV & X-ray Light Sources (EUVXRAY) 2024

Label-free quantitative material sensitive tomography with extreme ultraviolet light

Felix Wiesner, Silvio Fuchs, Martin Wünsche, Jan Nathanael, Johann J. Abel, Julius Reinhard, Slawomir Skruszewicz, Christian Rödel, Annett Gawlik, Gabriele Schmidl, Uwe Hübner, Jonathan Plentz, and Gerhard G. Paulus
W4B.5 Digital Holography and Three-Dimensional Imaging (DH) 2019

View More...
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use