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  • XVIII International Quantum Electronics Conference
  • Technical Digest Series (Optica Publishing Group, 1992),
  • paper PWe084

Time-Resolved Monitoring of Laser-Induced Spallation of Surface Films

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Abstract

Thin solid films are widely used today as protecting layers on surfaces, as coatings for mirrors, etc. However, their adhesion to the substrate often represents a problem. Noncontact techniques for the characterization of interface strengths and adhesion properties would thus be very valuable. Recently, a laser spallation scheme was reported which in principle permits the determination of the interface strength from the spallation threshold. However, the experimental precision was insufficient to derive actual interface strength data.[1]

© 1992 IQEC

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