Abstract
A scanned nanoprobe instrument (SNI), based on scanning-tuneling-microscope (STM) technology, has been developed at UTD for the purpose of nanoscale material modification and characterization.[1] Using the SNI guided by a novel optical viewing system, the first high-resolution STM images of quantum dots at identifiable locations were obtained.[2] In addition to imaging, the SNI can measure electrical and optical characteristics of individual quantum devices.
© 1992 IQEC
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