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Atomic-Resolution Dynamics by Electron Microscopy

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Abstract

Latest developments in high-resolution electron microscopes (HREMs) have made it possible to obtain localised real-space information on the atomic scale which has resulted in major insights into many important materials problems [1]. The HREM technique has also recently been shown to be applicable to the characterisation of surfaces in profile and initial surface studies of gold, catalysts and semiconductors have been very interesting.

© 1985 Optical Society of America

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