Abstract
Future dense wavelength division multiplexing systems operating at 40 Gbit/s pose a number of formidable metrology challenges. Among the phenomena requiring high-resolution characterization is chromatic dispersion, which broadens optical data pulses through the wavelength-dependent refractive index variation of system elements. At higher data rates, characterization of relative group delay (RGD) due to chromatic dispersion in components becomes critical to system throughput. In optical fibers, broadband descriptions of the chromatic dispersion are sufficient. However, it is more challenging to characterize optical components such as narrow-band filters for 40 Gbit/s data rates, since these systems may need sub-picosecond RGD resolution in bandwidths on the order of tens of pi-cometers. To help meet this industry challenge, the National Institute of Standards and Technology (NIST) has developed an RGD measurement technique targeted for 40 Gbit/s component metrology. Our technique relies on refinements to the established modulation phase shift method for measuring RGD,1 yielding enhanced phase stability over the time interval of the measurement. Given the many sources of absolute uncertainty in this measurement, the development of a calibration artifact with a theoretically predictable group delay is critical to the success of optical component measurements.2 We present experimental and theoretical results for the measurement of RGD of molecular gas absorption lines, which have the potential to be stable and well-characterized standards.
© 2002 Optical Society of America
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