Abstract
The Interdigitated-Metal-Semiconductor-Metal (IMSM) detector has recently become one of the more popular detectors for optoelectronic integration. The factors affecting the performance of this type of detector are reviewed particularly in the context of low noise amplification circuitry.
© 1989 Optical Society of America
PDF ArticleMore Like This
C. Jagannath, A. N. M. Masum Choudhury, B. Elman, and C. A. Armiento
TuA7 Integrated Photonics Research (IPR) 1990
C. Camperi-Ginestet, N. M. Jokerst, and S. Fike
FFF3 OSA Annual Meeting (FIO) 1992
G. K. CHANG, W. K. CHAN, N. E. SCHLOTTER, and R. BHAT
WF4 Optical Fiber Communication Conference (OFC) 1989