Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Wide Stiffness Range Cavity Optomechanical Sensors for Atomic Force Microscopy

Not Accessible

Your library or personal account may give you access

Abstract

We present chip-based sensors that integrate nanomechanical cantilevers with near-field optical readout for atomic force microscopy. Cantilever stiffness is varied over four orders of magnitude while maintaining fm/Hz1/2 displacement sensitivity, indicating potential in wide-ranging applications.

© 2012 Optical Society of America

PDF Article
More Like This
Cavity optomechanical sensors for atomic force microscopy

Kartik Srinivasan, Houxun Miao, Matthew T. Rakher, Marcelo Davanço, and Vladimir Aksyuk
CThJ2 CLEO: Science and Innovations (CLEO_SI) 2011

Integrated silicon optomechanical transducers and their application in atomic force microscopy

Jie Zou, Houxun Miao, Thomas Michels, and Vladimir Aksyuk
SF2M.7 CLEO: Science and Innovations (CLEO_SI) 2014

A MEMS Controlled Cavity Optomechanical Sensing System

Houxun Miao, Kartik Srinivasan, and Vladimir Aksyuk
CF3C.3 CLEO: Science and Innovations (CLEO_SI) 2012

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2022 | Optica Publishing Group. All Rights Reserved