Abstract
There is growing interest in the use of GeO2 for optical waveguides. This is due in part to the possibility of using optically induced changes in the refractive index (the photorefractive effect) to fabricate devices such as deflectors,1 filters,2 and multiplexers. Before these and other related applications can be exploited an understanding of the basic processes must be established. To this end we have fabricated high-quality GeO2 thin films and report here for the first time the observation of photorefractive effects in pure GeO2 thin-film waveguides.
© 1983 Optical Society of America
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