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  • Conference on Lasers and Electro-Optics Europe
  • Technical Digest Series (Optica Publishing Group, 2000),
  • paper CWF128

Tunable laser diode ESPI for high precision in-plane rotation measurement

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Abstract

We are here describing an ESPI technique based on a carrier generation on the object by wavelength shifting of the emission of a laser diode This techique generates reference fringes on the object Tilting of the fringes can be used for high sensitivity measurement of the angular rotation of the object

© 2000 IEEE

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