Abstract
Films composed by dielectric, semiconductor, metal nanocrystals or nanoparticles are an attractive optoelectronic materials, but to our knowledge the electronic structure of nanocrystals (cores and surfaces) prepared by various methods has been studied only in a limited way. In order to fill up the lacking of information on the subject, we carried out a series of measurements to define the structure of nanocrystals composing thermally deposited thin films.
© 2007 IEEE
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