Abstract

Ablation dynamics in metals and semiconductors upon fs-laser irradiation is nowadays well understood partly due to the observation of transient Newton rings [1], associated to the special optical properties of the ablating expanding layer. However, it has been generally assumed that this phenomenon cannot be observed in dielectrics due to the different excitation mechanism (e.g. multiphoton ionization) and optical properties of dielectrics (lower refractive index). In the present work, we report the observation of this same phenomena in dielectric materials, demonstrating the universality of the ablation mechanism.

© 2015 IEEE