Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Dispersion Engineering of High-Q Si3N4 Microdisk Resonators

Not Accessible

Your library or personal account may give you access

Abstract

We demonstrate Si3N4 waveguide-coupled microdisk resonators with a loaded Q-factor of 2.4×106 at 1550 nm. We tailor the cavity dispersion by increasing the Si3N4 microdisk thickness and using a thin oxide cladding.

© 2018 The Author(s)

PDF Article
More Like This
Characterization of Ultra-High-Q Si3N4 Micro-Ring Resonators with High-Precision Temperature Control

Paul Kaufmann, Xingchen Ji, Kevin Luke, Michal Lipson, and Sven Ramelow
JTu2A.72 CLEO: Applications and Technology (CLEO:A&T) 2018

High-Q Dispersion-Engineered Si3N4 Microresonators Based on a Subtractive Processing Technique

Zhichao Ye, Krishna Twayana, Peter A. Andrekson, and Victor Torres-Company
JTh2F.24 CLEO: Applications and Technology (CLEO:A&T) 2020

High-Q Ultrasensitive Spiral-Based Coupled-Resonator Device on a Si3N4 Platform for Sensing Applications

Xi Wu, Tianren Fan, Ali A. Eftekhar, Amir H. Hosseinnia, and Ali Adibi
FW4D.6 Frontiers in Optics (FiO) 2020

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.