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Terahertz Electric Field Microscopy of Ultrafast Near-fields

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Abstract

We present a new ultrafast field microscope based on the visible luminescence of semiconductor quantum dots. The quantum-confined Stark-effect enables the resolution of Terahertz near-fields beyond the diffraction limit.

© 2022 The Author(s)

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More Like This
Sampling the Terahertz Near-Field in Ultrafast Terahertz Scanning Tunneling Microscopy

Vedran Jelic, Peter H. Nguyen, Yang Luo, Daniel Mildenberger, Jesus A. M. Calzada, Tianwu Wang, and Frank A. Hegmann
JM2A.2 CLEO: Applications and Technology (CLEO:A&T) 2018

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SW5G.3 CLEO: Science and Innovations (CLEO:S&I) 2022

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P. C. M. Planken, C. W. E. M. van Rijmenam, and N. C. J. van der Valk
TuC1 Optical Terahertz Science and Technology (OTST) 2005

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