Platform independent integration of telluride thin films for high speed on-chip photodetection

Geun Ho Ahn; Alexander D. White; Hyungjin Kim; Hyungjin Kim; Naoki Higashitarumizu; Naoki Higashitarumizu; Felix M. Mayor; Jason F. Herrmann; Amir H. Safavi-Naeini; Ali Javey; Ali Javey; Jelena Vučković

doi:10.1364/CLEO_SI.2023.STh1O.3

CLEO 2023
Technical Digest Series (Optica Publishing Group, 2023),
paper STh1O.3
•https://doi.org/10.1364/CLEO_SI.2023.STh1O.3

Platform independent integration of telluride thin films for high speed on-chip photodetection

Geun Ho Ahn, Alexander D. White, Hyungjin Kim, Naoki Higashitarumizu, Felix M. Mayor, Jason F. Herrmann, Amir H. Safavi-Naeini, Ali Javey, and Jelena Vučković

CLEO: Science and Innovations 2023

San Jose, CA United States
7–12 May 2023
ISBN: 978-1-957171-25-8

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G. H. Ahn, A. D. White, H. Kim, N. Higashitarumizu, F. M. Mayor, J. F. Herrmann, A. H. Safavi-Naeini, A. Javey, and J. Vučković, "Platform independent integration of telluride thin films for high speed on-chip photodetection," in CLEO 2023, Technical Digest Series (Optica Publishing Group, 2023), paper STh1O.3.

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Abstract

We demonstrate platform-independent and scalable integration of tellurium thin film with photonic structures in silicon, silicon nitride and lithium niobate for ultra-broadband photodetection with a bandwidth of more than 40 GHz.

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