Abstract

We present the results of a study on atomic and electron structure of C:N single crystals prepared by sputter assisted plasma enhanced deposition in Ar/N ambient. The samples were characterized by high energy electron diffraction, TEM, Auger Electron and Raman Spectroscopy. The investigations show that at temperature of T=-100 °C C:N films were amorphous, but at higher temperatures they contain many microcrystallites some micrometer in size. The nitrogen content in the films depends on temperature. It was 36% at low temperatures and decreased slightly at higher temperatures. Raman spectrum possesses two broad peaks with maxima v=1350cm^–1 and v=1580 cm^–1. The first is due to =C=N- and thesecond C=C vibrational modes. No C-H vibration modeswere observed in C:N films.

© 1995 Optical Society of America