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Measuring ultralow emittance of laser-driven electron beams with spectroscopic imaging of inverse-Compton-scattered x-rays

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We report the first measurement of laser-wakefield-accelerated electron beam transverse emittance, as well as its evolution, performed via a novel, non-destructive, and single-shot technique employing spectroscopic imaging of x-rays produced by inverse-Compton scattering.

© 2016 Optical Society of America

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