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Conferences > IPRSN > 2022 > IW2B > IW2B.5

Point and planar defect complex in SiC nanowires for high-performance quantum emitters

Jin Hee Lee and Je-Hyung Kim

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Abstract

We investigate SiC nanowires that host point defects coupled to a few-layered stacking fault. These point-planar defect complexes exhibit outstanding optical properties of high brightness, fast recombination time, and a high Debye-Waller factor.

© 2022 The Author(s)

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