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Hyperspectral microscopy of two-dimensional semiconductors

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Abstract

We present wide-field hyperspectral microscopy images of photoluminescence from two-dimensional semiconductors. The microscope exploits Fourier-transform spectroscopy and uses a common-path birefringent interferometer. Our hyperspectral microscope is a fast tool to characterize 2D materials.

© 2022 The Author(s)

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