Raman Characterization of Catalysts

A. Wokaun; A. Baiker; W. Fluhr; M. Meier; S.K. Miller

doi:10.1364/MSBA.1985.MC1

Topical Meeting on Microphysics of Surfaces, Beams, and Adsorbates
Technical Digest Series (Optica Publishing Group, 1985),
paper MC1
•https://doi.org/10.1364/MSBA.1985.MC1

Raman Characterization of Catalysts

A. Wokaun, A. Baiker, W. Fluhr, M. Meier, and S.K. Miller

Microphysics of Surfaces, Beams, and Adsorbates 1985

Santa Fe, New Mexico United States
4–6 February 1985
ISBN:

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Session III (MC)

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A. Wokaun, A. Baiker, W. Fluhr, M. Meier, and S. K. Miller, "Raman Characterization of Catalysts," in Topical Meeting on Microphysics of Surfaces, Beams, and Adsorbates, Technical Digest Series (Optica Publishing Group, 1985), paper MC1.

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Abstract

The use of surface enhanced Raman scattering as a tool for the elucidation of reaction mechanisms in heterogeneous catalysis is investigated. The following information is desired:

- identification of the molecular species adsorbed at the surface, even if present in low concentrations; this includes reactants, major and side products;

- type and geometry of bonding to the surface;

- detection of intermediates which exist only as surface species.

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