Electron, Ion, and Photon Beam Induced Reduction of SnO2(110): Power Dissipation Thresholds

J. W. Erickson

doi:10.1364/MSBA.1989.WC3

Microphysics of Surfaces, Beams and Adsorbates
Technical Digest Series (Optica Publishing Group, 1989),
paper WC3
•https://doi.org/10.1364/MSBA.1989.WC3

Electron, Ion, and Photon Beam Induced Reduction of SnO₂(110): Power Dissipation Thresholds

J. W. Erickson

Microphysics of Surfaces, Beams, and Adsorbates 1989

Salt Lake City, Utah United States
27 February–1 March 1989
ISBN:

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Session 9, Poster Session (WC)

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J. W. Erickson, "Electron, Ion, and Photon Beam Induced Reduction of SnO2(110): Power Dissipation Thresholds," in Microphysics of Surfaces, Beams and Adsorbates, Technical Digest Series (Optica Publishing Group, 1989), paper WC3.

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Abstract

Incident electrons, ions, and photons stimulate oxygen desorption from SnO₂ (110). Power absorption thresholds characterize other surface and near-surface processes.

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