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All-fiber scanning differential phase interference optical microscope

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Abstract

The microscope examination of samples displaying minute structural variation has become possible by means of differential systems. Scanning techniques have also recently been introduced for this purpose. Due to their bulk-optics based designs, however, the existing scanning systems require precise alignment of a number of components, thus necessitating the use of an optical bench. In addition, the optical and electronic designs of these systems are quite complex. The design and characteristics of a fiber-based differential phase contrast optical microscope are described. The use of optical fiber renders the system more robust and simpler to implement. The operation of the system is discussed from a theoretical viewpoint, and a number of experimental results are presented. The sensitivity implications of the design are also discussed.

© 1985 Optical Society of America

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