Open Access
Add to BibSonomyAbstract
Optical constants of thin Ag films (~50 nm thick) deposited by thermal evaporation on prisms were measured at 632.8 nm by the attenuated total reflection method. The effects of Ar-ion energy and current on the refractive index and extinction coefficient of IAD Ag films are presented. Their electrical resistivity, measured with a four-point probe, is also discussed. Finally, the results of humidity tests are described.
© 1987 Optical Society of America
PDF ArticleMore Like This
C.K. Hwangbo, L.J. Lingg, J.P. Lehan, M.R. Jacobson, H.A. Macleod, J.L. Makhous, and S.Y. Kim
ThB9 Optical Interference Coatings (OIC) 1988
Ghanim A. Al-Jumaily, L. Yazlovitsky, T. Mooney, and A. Smajkiewicz
THS6 OSA Annual Meeting (FIO) 1987
J. D. Targove, M. J. Messerly, and H. A. Macleod
THPO41 OSA Annual Meeting (FIO) 1987