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Conferences > OAM > 1989 > MNN > MNN6

Thermal stress in zirconium dioxide thin films

Yalan Mao, B. G. Bovard, J. P. Lehan, T. Zhao, D. Olinger, and H. Angus Macleod

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Abstract

The total stress is composed of the intrinsic stress due to growth mechanisms, the thermal stress due to the thermal expansion mismatch between film and substrate, and the external stress due to external loading. If thermal stress is increased, brittle materials (ceramics) crack while plastic materials (metals) deform until they melt. Zirconium dioxide is a refractory ceramic with valuable optical properties. Its stress behavior under temperature cycling is investigated.

© 1989 Optical Society of America

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